MIYOSHI T. | Department of Electrical and Electronics Engineering, Kobe University
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概要
Department of Electrical and Electronics Engineering, Kobe University | 論文
- An On-Chip PVT Compensation Technique with Current Monitoring Circuit for Low-Voltage CMOS Digital LSIs
- Atomic configuration of boron pile-up at the Si/SiO2 interface
- Influences of Point and Extended Defects on As Diffusion in Si(Structure and Mechanical and Thermal Properties of Condensed Matter)
- Ultralow-Power Current Reference Circuit with Low Temperature Dependence(Building Block, Analog Circuit and Device Technologies)
- Watch-Dog Circuit for Quality Guarantee with Subthreshold MOSFET Current(New System Paradigms for Integrated Electronics)