Katayama Takeshi | Research Center for Nanodevices and Systems, Hiroshima University, 1-4-2 Kagamiyama, Higashi-Hiroshima 739-8527, Japan
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概要
- 同名の論文著者
- Research Center for Nanodevices and Systems, Hiroshima University, 1-4-2 Kagamiyama, Higashi-Hiroshima 739-8527, Japanの論文著者
Research Center for Nanodevices and Systems, Hiroshima University, 1-4-2 Kagamiyama, Higashi-Hiroshima 739-8527, Japan | 論文
- Accuracy of Secondary Ion Mass Spectrometry Depth Profiling for Sub-keV As+ Implantation
- Organic Contamination Dependence of Process-Induced Interface Trap Generation in Ultrathin Oxide Metal Oxide Semiconductor Transistors
- Effect of Light Irradiation on Native Oxidation of Silicon Surface
- Structural and Optical Properties of Electro-Optic Material: Sputtered (Ba,Sr)TiO3
- Low-$k$ Dielectric Film Patterning by X-Ray Lithography