Relationship between Surface Roughness of Indium Tin Oxide and Leakage Current of Organic Light-Emitting Diode
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概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2003-04-15
著者
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Lee M‐h
Department Of Applied Electronics Yeungnam University
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Yoon Myung-hee
Oled Division Lg Elite Lg Electronics
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Lee Moon-ho
Department Of Applied Electronics Yeungnam University
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Han Yoon-soo
Oled Division Lg Elite Lg Electronics
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KIM Ki-Beom
Department of Applied Electronics, Yeungnam University
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TAK Yoon-Heung
OLED Division, LG Elite, LG Electronics
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BAIK Kwang-Heum
OLED Division, LG Elite, LG Electronics
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Kim Ki-beom
Department Of Applied Electronics Yeungnam University
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Baik Kwang-heum
Oled Division Lg Elite Lg Electronics
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Tak Yoon-heung
Oled Division Lg Elite Lg Electronics
関連論文
- Relationship between Surface Roughness of Indium Tin Oxide and Leakage Current of Organic Light-Emitting Diode
- Numerical Modeling; Thickness Dependence of J-V Characteristic for Multi-Layered OLED Device
- Relationship between Surface Roughness of Indium Tin Oxide and Leakage Current of Organic Light-Emitting Diode
- Numerical Modeling ; Thickness Dependence of J-V Characteristic for Multi-Layered OLED Device