Numerical Modeling ; Thickness Dependence of J-V Characteristic for Multi-Layered OLED Device

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概要

• 論文の詳細を見る
• 2012-11-01

著者

• Tak Yoon-heung

  Oled Division Lg Elite Lg Electronics

• CHOI Hong-Seok

  OLED Development Center, LG Display

• AHN Byung-Chul

  OLED Development Center, LG Display

• LEE Sang-Gun

  OLED Development Center, LG Display

• LEE Seok-Jong

  OLED Development Center, LG Display

• HAN Chang-Wook

  OLED Development Center, LG Display

関連論文

• Relationship between Surface Roughness of Indium Tin Oxide and Leakage Current of Organic Light-Emitting Diode
• Numerical Modeling; Thickness Dependence of J-V Characteristic for Multi-Layered OLED Device
• Relationship between Surface Roughness of Indium Tin Oxide and Leakage Current of Organic Light-Emitting Diode
• Numerical Modeling ; Thickness Dependence of J-V Characteristic for Multi-Layered OLED Device

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