Localized Electroless Ag Plating at a Tip Apex for Scanning Kelvin Probe Microscopy (Special Issue : Microprocesses and Nanotechnology)
スポンサーリンク
概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
著者
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Shiao Ming-hua
Instrument Technology Research Center National Applied Research Laboratories
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Lin Chun-Ting
Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu 300, Taiwan
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Yu Ming-Han
Institute of Nanoscience, National Chung Hsing University, Taichung 402, Taiwan
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Su James
Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu 300, Taiwan
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Chen Po-Li
Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu 300, Taiwan
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Nemcsics Akos
Institute for Microelectronics and Technology, Obuda University, H-1084 Budapest, Hungary
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Chang Mao-Nan
Institute of Nanoscience, National Chung Hsing University, Taichung 402, Taiwan
関連論文
- Effects of Ion Assistance and Substrate Temperature on Optical Characteristics and Microstructure of MgF_2 Films Formed by Electron-Beam Evaporation
- Fabrication of Nanocone Subwavelength Antireflection Structures on Quartz Substrates
- Localized Electroless Ag Plating at a Tip Apex for Scanning Kelvin Probe Microscopy
- Localized Electroless Ag Plating at a Tip Apex for Scanning Kelvin Probe Microscopy (Special Issue : Microprocesses and Nanotechnology)