Improvement of flare modeling and derivation for extreme ultraviolet optics (Special issue: Microprocesses and nanotechnology)
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
著者
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Shiraishi Masayuki
Precision Equipment Company Nikon Corporation
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Oshino Tetsuya
Precision Equipment Company Nikon Corporation
関連論文
- Fabrication of 0.1μm Line-and-Space Patterns using Soft X-Ray Reduction Lithography
- Improvement of the Uniformity of Tungsten / Carborn Multilayers by Thermal Processing
- Normal-Incidence X-Ray Microscope for Carbon Kα Radiation with 0.5 μm Resolution
- Ring-Field Extreme Ultraviolet Exposure System Using Aspherical Mirrors
- Improvement of flare modeling and derivation for extreme ultraviolet optics (Special issue: Microprocesses and nanotechnology)
- Low-Stress Molybdenum/Silicon Multilayer Coatings for Extreme Ultraviolet Lithography