Rewrite characteristics of a scattered-type superresolution near-field structure optical disk with a Ag2O mask layer

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文

著者

• Tamura Naoyoshi

  Fujitsu Lab. Ltd. Tokyo Jpn

関連論文

• Investigation of Degradation model for Ultra-thin Gate Dielectrics
• Rewrite characteristics of a scattered-type superresolution near-field structure optical disk with a Ag2O mask layer
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