Low-power switching of nonvolatile resistive memory using hafnium oxide (Special issue: Solid state devices and materials)
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
著者
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Wang Ching-chiun
Electronics And Optoelectronics Research Laboratories Industrial Technology Research Institute
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Lee Heng-yuan
Electronics And Optoelectronics Research Laboratories Industrial Technology Research Institute
関連論文
- TiO2 nanocrystal prepared by atomic-layer-deposition system for non-volatile memory application (Special issue: Solid state devices and materials)
- HfO_2/HfAlO/HfO_2 Nanolaminate Charge Trapping Layers for High-Performance Nonvolatile Memory Device Applications
- Low-power switching of nonvolatile resistive memory using hafnium oxide (Special issue: Solid state devices and materials)
- Low Power Operation of Non-volatile Hafnium Oxide Resistive Memory
- HfO2/HfAlO/HfO2 Nanolaminate Charge Trapping Layers for High-Performance Nonvolatile Memory Device Applications