Secondary Ion Mass Spectrometry of Organic Thin Films Using Metal-Cluster-Complex Ion Source

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概要

• 論文の詳細を見る
• Japan Society of Applied Physicsの論文

著者

• Fujiwara Yukio

  Research Institute Of Instrumentation Frontier (riif) National Institute Of Advanced Industrial Scie

関連論文

• Production of Stable Ion Beam of Os_3(CO)_ with Compact Metal-Cluster-Complex Ion Source
• Observation of Sputtered Si Surface Irradiated with Metal Cluster Complex Ions
• Secondary Ion Mass Spectrometry of Organic Thin Films Using Metal-Cluster-Complex Ion Source

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