Data Analysis of X-ray Fluorescence Holography by Subtracting Normal Component from Inverse Hologram
スポンサーリンク
概要
- 論文の詳細を見る
X-ray fluorescence holography (XFH) is a powerful technique for determining three-dimensional local atomic arrangements around a specific fluorescing element. However, the raw experimental hologram is predominantly a mixed hologram, i.e., a mixture of hologram generated in both normal and inverse modes, which produces unreliable atomic images. In this paper, we propose a practical subtraction method of the normal component from the inverse XFH data by a Fourier transform for the calculated hologram of a model ZnTe cluster. Many spots originating from the normal components could be properly removed using a mask function, and clear atomic images were reconstructed at adequate positions of the model cluster. This method was successtully applied to the analysis of experimental ZnTe single crystal XFH data.
- 2010-11-25
著者
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HAYASHI Kouichi
Institute for Materials Research, Tohoku University
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Hosokawa Shinya
Center For Materials Research Using Third-generation Synchrotron Facilities Hiroshima Institute Of T
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Hosokawa Shinya
Center for Materials Research Using Third-Generation Synchrotron Radiation Facilities, Hiroshima Institute of Technology, Hiroshima 731-5193, Japan
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Happo Naohisa
Graduate School of Information Sciences, Hiroshima City University, Hiroshima 731-3194, Japan
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