Photoluminescence Studies of Mg-Doped AlxGa1-xAs Epitaxial Layers Grown by Molecular Beam Epitaxy
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概要
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Magnesium (Mg)-doped AlxGa1-xAs epitaxial layers were grown by molecular beam epitaxy (MBE) at various substrate temperatures, Al mole fractions, and As/Ga beam equivalent pressure (BEP) ratios. The optical properties were investigated by photoluminescence (PL) spectroscopy. The PL emission peak intensity was increased and the emission peak was slightly blue shifted from 700.7 to 697.3 nm when the substrate temperature was increased. The full width at half maximum (FWHM) was decreased from 29.6 to 19 meV when the substrate temperature was increased. The other growth parameters, such as the As/Ga BEP ratio and the Al mole fraction, also affected the optical properties of the Mg-doped AlxGa1-xAs epilayers. The anomalous behavior of the blue- and red-shift of the PL peak energy was observed also to be temperature dependent.
- 2009-04-25
著者
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Kim Min
School Of Mechanical And Aerospace Engineering Seoul National University
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Kim Do
School Of Advanced Materials Engineering Chonbuk National University
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Kim Jin
Division Of Applied Life Science (bk21 Program) Institute Of Agricultural & Life Sciences Depart
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Leem Jae-Young
School of Nano Engineering, Institute of Nano Manufacturing, Inje University, Gimhae 621-749, Korea
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Kim Jong
Adavanced Photonics Research Institute, GIST, Gwangju 500-712, Korea
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Son Jeong-Sik
Department of Visual Optics, Kyungwoon University, Gumi, Gyeongbuk 730-850, Republic of Korea
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Lee Dong-Yul
Lighting Module Research and Development, Samsung Electro-Mechanics Co., Ltd., Suwon 443-373, Korea
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Park Ho
School of Nano Engineering, Institute of Nano Manufacturing, Inje University, Gimhae 621-749, Korea
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Kim Min
School of Nano Engineering, Institute of Nano Manufacturing, Inje University, Gimhae 621-749, Korea
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Kim Do
School of Nano Engineering, Institute of Nano Manufacturing, Inje University, Gimhae 621-749, Korea
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Kim Jin
Division of Advanced Materials Engineering, Chonbuk National University, Jeonju 561-756, Korea
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Son Jeong-Sik
Department of Visual Optics, Kyungwoon University, Gumi 730-850, Korea
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