Direct Measurement of Transfer Functions in Kelvin Probe Force Microscopy Using Artificially Patterned Surface Potentials
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概要
- 論文の詳細を見る
We report a direct measurement of two-dimensional (2D) transfer functions of conductive probes used in Kelvin probe force microscopy (KFM). The 2D transfer functions are obtained by measuring a well-defined step pattern of surface potentials, prepared on thin films of tris(8-hydroxyquinolinato)aluminum(III) (Alq3) by contact-mask exposure. The experimentally obtained 2D transfer functions are highly asymmetric and are spread over 50 μm. A new finding is the observation of negative values in the KFM transfer function, which cannot be explained by conventional KFM formula. The reconstruction of true surface-potential profiles by model-fitting calculation is demonstrated. The technique presented in this study, i.e., the preparation of surface-potential patterns on Alq3 thin films, is ideal for determining the KFM transfer functions experimentally.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2008-07-25
著者
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Maeda Mizuo
Riken
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OZASA Kazunari
RIKEN (The Institute of Physical and Chemical Research)
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Hara Masahiko
Riken
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Hara Masahiko
RIKEN (The Institute of Physical and Chemical Research), 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
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Nemoto Shigeyuki
RIKEN (The Institute of Physical and Chemical Research), 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
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Isoshima Takashi
RIKEN (The Institute of Physical and Chemical Research), 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
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Ito Eisuke
RIKEN (The Institute of Physical and Chemical Research), 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
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Maeda Mizuo
RIKEN (The Institute of Physical and Chemical Research), 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
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Ozasa Kazunari
RIKEN (The Institute of Physical and Chemical Research), 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
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