X-ray Holographic Microscopy using Total-Reflection Mirror Interferometer
スポンサーリンク
概要
- 論文の詳細を見る
An optical system for X-ray holographic microscopy has been developed using a Fresnel zone plate objective lens and a wavefront-dividing interferometer with total-reflection mirror optics. A plane mirror is placed behind the back focal plane of the objective lens, and half of a divergent wave from the focal point is deflected by the total-reflection mirror and overlapped onto the magnified image of the object. This interferometer is an analogue of a Lloyd's mirror interferometer, which is well known in visible light optics. By using fully coherent illumination to the objective lens, holographic microscopy was successfully performed. A quantitative phase image was obtained by the fringe scan method using a rotating phase shifter. The spatial resolution of the phase image is approximately 200 nm, and the phase sensitivity is estimated to be better than $\lambda/60$ at an X-ray wavelength of 1.0 Å.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2008-11-25
著者
-
Takeuchi Akihisa
Japan Synchrotron Radiation Res. Inst. (jasri) 1-1-1 Kouto Mikazuki-cho Sayo-gun Hyogo 679-5198 Jpn
-
SUZUKI Yoshio
Japan Synchrotron Radiation Research Institute
-
Takeuchi Akihisa
Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, Koto, Sayo, Hyogo 679-5198, Japan
-
Suzuki Yoshio
Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, Koto, Sayo, Hyogo 679-5198, Japan
関連論文
- 2P369 Microtomographic analysis of Drosophila brain(44. Neuro-biophysics,Poster Session,Abstract,Meeting Program of EABS & BSJ 2006)
- Suppression of Corrugated Boundaries in Multilayer Fresnel Zone Plate for Hard X-Ray Synchrotron Radiation Using Cylindrical Slit
- Sub-100nm Hard X-Ray Microbeam Generation with Fresnel Zone Plate Optics
- Differential Phase X-ray Imaging Microscopy with X-ray Talbot Interferometer
- Performance Test of Fresnel Zone Plate with 50nm Outermost Zone Width in Hard X-ray Region
- Hard X-Ray Microtomography Using X-Ray Imaging Optics
- X-Ray Phase Imaging with Single Phase Grating
- Phase Tomography by X-ray Talbot Interferometry for Biological Imaging
- Synchrotron Micro-XRF Measurements of Trace Element Distributions in BGA Type Solders and Solder Joints
- Four-Dimensional Annihilation Behaviors of Micro Pores during Surface Cold Working
- X-ray Holographic Microscopy by Double-Prism Interferometer
- Characterization of a Hard X-ray Telescope at Synchrotron Facility SPring-8
- Application of Dual-Energy K-Edge Subtraction Imaging to Assessment of Heat Treatments in Al-Cu Alloys
- X-ray Microfocusing by Combination of Grazing-Incidence Spherical-Concave Mirrors
- Performance Test and Evaluation of Multilevel Fresnel Zone Plate with Three-Step Profile Fabricated with Electron-Beam Lithography
- Gabor Holography with Speckle-Free Spherical Wave in Hard X-ray Region
- High-resolution Observation of Steel Using X-ray Tomography Technique
- Phase Tomography by X-ray Talbot Interferometry for Biological Imaging
- Suppression of Corrugated Boundaries in Multilayer Fresnel Zone Plate for Hard X-Ray Synchrotron Radiation Using Cylindrical Slit
- Hard X-Ray Microtomography Using X-Ray Imaging Optics
- Resolution Limit of Refractive Lens and Fresnel Lens in X-Ray Region
- Performance Test of Fresnel Zone Plate with 50 nm Outermost Zone Width in Hard X-ray Region
- Hard X-ray Microprobe and Scanning Microscopy with Spherical-Aberration-Corrected Grazing-Incident Spherical-Concave Mirror Optics
- X-ray Holographic Microscopy using Total-Reflection Mirror Interferometer
- Sub-100 nm Hard X-Ray Microbeam Generation with Fresnel Zone Plate Optics
- Visualization of nanoscale deformation in polymer composites with zernike-type phase-contrast X-ray microscopy and the finite element method