Direct Measurement of 185 nm Radiation from Low-Pressure Mercury Lamps Using Diamond-Based Vacuum Ultraviolet Sensors
スポンサーリンク
概要
- 論文の詳細を見る
We present experimental results that show the importance of the direct measurement of the irradiance of 185 nm radiation from low-pressure mercury (Hg) lamps in vacuum ultraviolet (VUV)/O3 surface dry cleaning. It was found that the contact angles of water droplets on glass substrates can be correlated with the accumulated irradiance of the 185 nm radiation, not that from the 254 nm radiation that is conventionally monitored for the dry cleaning process control. Because the diamond-based VUV sensors are sensitive only to the 185 nm radiation, they could be a useful monitoring tool for controlling the VUV dry cleaning process in which low-pressure Hg lamps are used.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2006-08-15
著者
-
Hayashi Kazushi
Kobe Steel Ltd. Electronics Research Laboratory
-
Ono Ken-ichiro
Iwasaki Electric Co., Ltd., 1-1 Ichiriyama-cho, Gyoda, Saitama 361-8585, Japan
-
Suzuki Fumio
Iwasaki Electric Co., Ltd., 1-1 Ichiriyama-cho, Gyoda, Saitama 361-8585, Japan
-
Sakai Kazuhiro
Iwasaki Electric Co., Ltd., 1-1 Ichiriyama-cho, Gyoda, Saitama 361-8585, Japan
関連論文
- Measurement of Vacuum Ultraviolet Radiation with Diamond Photo Sensors
- Diamond Sensors Durable for Continuously Monitoring Intense Vacuum Ultraviolet Radiation
- Diamond Film Gas Sensors for Leak Detection of Semiconductor Doping Gases
- Measurement of Vacuum Ultraviolet Radiation of Low-Pressure Mercury Lamps Using Photoconductors Made of Synthetic Diamond Films
- Application of Microwave Photoconductivity Decay Method to Characterization of Amorphous In-Ga-Zn-O Films
- Direct Measurement of 185 nm Radiation from Low-Pressure Mercury Lamps Using Diamond-Based Vacuum Ultraviolet Sensors
- Application of Microwave Photoconductivity Decay Method to Characterization of Amorphous In-Ga-Zn-O Films