Thickness Determination of LB Films by X-Ray Diffraction
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概要
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X-ray diffraction patterns of amorphous-polymer LB films were investigated in detail, and weak peaks at low $2\theta$ angles were found to correspond to the film thickness. The diffractions are considered to be the results of Fourier transformation of two component systems: one at the interface of air and amorphous film, and the other at that of the film and substrate.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 1989-10-20
著者
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OKADA Shuji
Research Institute for Polymers and Textiles
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MATSUDA Hiro
Research Institute for Polymers and Textiles
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NAKANISHI Hachiro
Research Institute for Polymers and Textiles
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KATO Masao
Research Institute for Polymers and Textiles
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Matsuda Hiro
Research Institute for Polymers and Textiles, 1-1-4 Higashi, Tsukuba, Ibaraki 305
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Nishiyama Tsutomu
Tsukuba Branch, Tokyo Research Laboratory, Shimadzu Co. Ltd., 3-17-1 Azuma, Tsukuba, Ibaraki 305
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Nakanishi Hachiro
Research Institute for Polymers and Textiles, 1-1-4 Higashi, Tsukuba, Ibaraki 305
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