Four-Terminal Electrical Measurement of a DNA Molecular Bundle Captured by Silicon Nanotweezers

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概要

• 論文の詳細を見る

• We measured the electrical characteristics of DNA molecular bundles that were 25-µm long and had a diameter of 100-500 nm. We captured the bundle between the tips of silicon nanotweezers by dielectrophoresis. The two-terminal measurement, which used only the tweezers, failed because of the contact resistance between the bundle and the tips. We adopted a four-terminal measurement that eliminated the effect of the contact resistance. We fabricated potential measurement probes, which consisted of 2-µm-wide line electrodes with a 4-µm separation. The captured DNA bundle was pressed against the probes, and the potential drop associated with the current in the bundle was measured. We successfully determined the conductivity of the bundle.

• The Institute of Electrical Engineers of Japanの論文

著者

• Jalabert Laurent

  Limms/cnrs-iis And Cirmm University Of Tokyo

• Collard Dominique

  Limms/cnrs-iis The University Of Tokyo

• Fujita Hiroyuki

  Cirmm

• Fujita Hiroyuki

  CIRMM, Institute of Industrial Science, The University of Tokyo

• Usami Masataka

  CIRMM, Institute of Industrial Science, The University of Tokyo

• Ishida Tadashi

  CIRMM, Institute of Industrial Science, The University of Tokyo

• Kumemura Momoko

  CIRMM, Institute of Industrial Science, The University of Tokyo

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• Four-Terminal Electrical Measurement of a DNA Molecular Bundle Captured by Silicon Nanotweezers
• Four-Terminal Electrical Measurement of a DNA Molecular Bundle Captured by Silicon Nanotweezers

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