Determination of Surface Compositions of Pt-Ru Alloy Thin Films Using Cu Stripping Voltammetry
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概要
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Pure Pt, Pure Ru, and Pt-Ru alloy thin films of different compositions (Ru:Pt=0.5–2.0) were prepared by magnetron sputtering. These thin films were characterized by Cu stripping voltammetry at different deposition potentials. Furthermore, we developed a novel technique to determine the surface Ru/Pt ratio of Pt-Ru alloys using Cu stripping voltammetry. The Ru/Pt ratios calculated from Cu stripping data agreed well with those measured by EDX in the Ru/Pt range of 0.6 to 2.0.
- 公益社団法人 電気化学会の論文
著者
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Ikeda Toru
Department Of Chemical Engineering Faculty Of Engineering Kyushu University
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Yamada Hirohisa
Department Of Chemical Engineering Nara National College Of Technology
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INABA Minoru
Department of Applied Chemistry, Graduate School of Engineering, Doshisha University
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TASAKA Akimasa
Department of Applied Chemistry, Graduate School of Engineering, Doshisha University
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SHIMODA Daisuke
Department of Molecular Chemistry and Biochemistry, Faculty of Science and Engineering, Doshisha University
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