Dielectric properties of organic monolayers directly bonded on silicon probed by current sensing atomic force microscope
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概要
- 論文の詳細を見る
The dielectric properties of alkyl monolayers with various chain lengths [CH3(CH2)n–1- (n = 12, 14, 16, and 18)] covalently bonded to a hydrogen terminated n-type silicon (111) surface in a nanoscale region were evaluated using current sensing atomic force microscopy (AFM). A reliable electrical contact between the alkyl monolayers and the metal-coated AFM tip was achieved under slight stress. At a force less than 2 nN, current sharply increased as the bias was scanned over a critical value, showing that breakdown took place. The breakdown voltage linearly depended on the chain length of the alkyl monolayers and the dielectric strength of 2.0 GV/m was derived from the slope of this relation.
- American Institute of Physicsの論文
- 2003-09-08
著者
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UOSAKI Kohei
Division of Chemistry, Graduate School of Science, Hokkaido University
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Uosaki Kohei
Division Of Chemistry Graduate School Of Science Hokkaido University
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Uosaki Kohei
Department Of Chemistry Faculty Of Science Hokkaido University
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