Dependence of Ag film thickness on Formation of Ag Nano-crystals to Fabricate Polymer Nonvolatile Memory(Session 2A : Memory 1)
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概要
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We have investigated the effect of Ag Nano-crystals on nonvolatile memory-cell fabricated whit a conductive polymer such as PVK. The structure of polymer nonvolatile memory-cell was PVK / Ag nano-crystals / PVK between the Al electrodes which feature size is the 4F^2 embedded with Ag nano-crystals in PVK (poly(N-vinylcarbazole). The polymer nonvolatile memory-cell embedded with Ag nano-crystals formed by the basis of 5-nm Ag film showed the memory margin (ratio of I_<on> to I_<off>) is 〜5.0×10^1 and the retention time is more than 10^5 seconds. Therefore, it was confirmed that Ag nano-crystal's shape, size, isolation and distribution determine a nonvolatile memory characteristics.
- 2010-06-23
著者
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Lee Jong-Dae
National Program Center for Tera-bit-level Nonvolatile Memory Development, Dept. of Electrical and C
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Seung Hyun-Min
National Program Center for Tera-bit-level Nonvolatile Memory Development, Dept. of Electrical and C
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Kwon Kyoung-Cheol
National Program Center for Tera-bit-level Nonvolatile Memory Development, Dept. of Electrical and C
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Park Jea-Gun
National Program Center for Tera-bit-level Nonvolatile Memory Development, Dept. of Electrical and C
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Lee Jong-dae
National Program Center For Tera-bit-level Nonvolatile Memory Development Dept. Of Electrical And Co
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Seung Hyun-min
National Program Center For Tera-bit-level Nonvolatile Memory Development Dept. Of Electrical And Co
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Park Jea-gun
National Program Center For Tera-bit-level Nonvolatile Memory Development Dept. Of Electrical And Co
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Kwon Kyoung-cheol
National Program Center For Tera-bit-level Nonvolatile Memory Development Dept. Of Electrical And Co
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Park Jea-gun
National Program Center For Tera-bit-level Nonvolatile Memory Development Department Of Electronics
関連論文
- Dependence of Ag film thickness on Formation of Ag Nano-crystals to Fabricate Polymer Nonvolatile Memory(Session 2A : Memory 1)
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