Correlation of Electrical, Thermal and Structural Properties of Microcrystalline Silicon Thin Films : Semiconductors
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概要
- 論文の詳細を見る
Thermal diffusivity (α) has been correlated with the electrical and structural properties of hydrogenated microcrystalline silicon (μc-Si:H) films. In the heterogeneous microcrystalline network, α and electrical conductivity (σ_D) maintain a one-to-one correspondence, and both these parameters are directly related to the crystalline volume fraction (F_c) of the network. For the amorphous silicon network, α is 〜 0.2 cm^2・s^<-1> and has a very low σ_D of 〜 10^<-8>S・cm^<-1>. When the crystalline volume fraction (F_c) exceeds a certain percolation threshold, both α and σ_D increase abruptly. Undoped μc-Si:H films having F_c〜94% exhibit a high magnitude of α 〜 0.80cm^2・s^<-1> and a very high σ_D of 〜 10^<-3>S・cm^<-1>.
- 社団法人応用物理学会の論文
- 2002-03-01
著者
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Chen Li
Centre For Condensed Matter Sciences National Taiwan University
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CHEN Kuei
Institute of Atomic and Molecular Sciences, Academia Sinica
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Chen Kuei
Institute Of Atomic And Molecular Sciences Academia Sinica
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Das Debajyoti
Energy Research Unit Indian Association For The Cultivation Of Science:institute Of Atomic And Molec
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Das Debajyoti
Energy Research Unit Indian Association For The Cultivation Of Science
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JANA Madhhusudan
Energy Research Unit, Indian Association for the Cultivation of Science
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BARUA Ashok
Energy Research Unit, Indian Association for the Cultivation of Science
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CHATTOPADHyan Surajit
Centre for Condensed Matter Sciences, National Taiwan University
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Jana Madhusudan
Energy Research Unit Indian Association For The Cultivation Of Science
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Barua Ashok
Energy Research Unit Indian Association For The Cultivation Of Science
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Jana Madhhusudan
Energy Research Unit Indian Association For The Cultivation Of Science
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Chattopadhyan Surajit
Centre For Condensed Matter Sciences National Taiwan University
関連論文
- Study of a Super-Resolution Optical Structure : Polycarbonate/ZnS-SiO_2/ZnO/ZnS-SiO_2/Ge_2Sb_2Te_5/ZnS-SiO_2
- Highly Conducting Undoped μc-SiO:H Films Prepared by RF Glow Discharge
- Control of Crystallization at Low Thickness in μc-Si:H Films Using Layer-by-Layer Growth Scheme
- Wide Band Gap Si:H at Low H-Content Prepared by Interrupted Grown and H-Plasma Treatment
- Correlation of Electrical, Thermal and Structural Properties of Microcrystalline Silicon Thin Films : Semiconductors
- Study of a Super-Resolution Optical Structure: Polycarbonate/ZnS–SiO2/ZnO/ZnS–SiO2/Ge2Sb2Te5/ZnS–SiO2
- Effect of Deposition Temperature on the Properties of Magnetron Sputtered Hydrogenated Amorphous Silicon Films