Crystallization Process of Amorphous Alloys (Co_<1-x>Fe_x)_<74.5>Si_<13.5>B_<12> of x=0.06, 0.5 and 1.0 : Mossbauer and X-ray diffraction measurements

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The crystallization processes of amorphous alloys (Co_<l-x>Fe_x)_<74.5>Si_<13.5>B_<12> of x=0.06, 0.5 and 1.0 have been studied by using the Mossbauer and the X-ray diffraction measurements. Each sample is annealed near its crystallization temperature isothermally. For the three kinds of samples, as the annealing time is increased, firstly the metallic phases precipitate and then the metalloid phases follow. For the sample of x=0.06, some amount of Si atom which once dissolved in the precipitated metallic phase is found to be expended when the metalloid Si compound precipitates. On the other hand, for the samples of x=0.5 and x=1.0, the Si atoms stay in the precipitated metallic phase and no Si compound is detected during the heat-treatment. The number of sites of Fe atoms in the precipitated metallic phases is found to be one for the samples of x=0.06 and x=0.5 but five for the sample of x=1.0.
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