Resonant Inelastic X-ray Scattering of EuNi_2(Si_<1-x>Ge_x)_2 and Eu_2O_3 at Eu L_3 Absorption Edge (Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties)

概要

論文の詳細を見る
Bulk sensitive spectroscopies were performed for mixed valent compounds EuNi_2(Si_<1-x>Ge_x)_2 as a function of x, and Eu-sesquioxide (Eu_2O_3), using techniques of high-resolution partial-fluorescence yield (PFY) and resonant inelastic x-ray scattering (RIXS) at the Eu L_3 absorption edge. The evolution of mean-valency as a function of chemical composition x in EuNi_2(Si_<1-x>Ge_x)_2 shows a drastic change between x=0.5 and 0.7. The experimental results also show a small amount of mixed valency for the end members, i.e., x=1 and 0 samples are also mixed valent. Single-impurity Anderson model calculations show good agreement with the PFY and RIXS experimental results, and thus provide a consistent set of electronic structure parameters. The composition controlled drastic change in meanvalence between x=0.5 and 0.7 is derived from a large hybridization change, consistent with the Kondo volume collapse picture.
社団法人日本物理学会の論文
2006-03-15