PA20 電傾効果における層構造と分子配向の動的微小領域X線回折法による評価(2004年日本液晶学会討論会)

概要

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The local layer structure and the molecular orientation of the SmA phase in the electroclinic effect has been measured using synchrotron time resolved microbeam X-ray diffraction. By applying the electric field, the initial bookshelf structure transforms to the combination of the horizontal and vertical chevron. The change in the local molecular orientation was observed directly by the X-ray halo pattern as a function of the applied voltage. The molecular tilt angle shows the sinusoidal variation as a function of the position across the stripe texture. The magnitude of the angular change, however, is smaller than that expected from the chevron angle of the local layer structure.
日本液晶学会の論文
2004-09-26