Reduction of Radiation-Induced Leakage Currents in Thin Oxides by Application of a Low Post-Irradiation Gate Bias

Department Of Electrical Engineering The National University Of Singapore

Deptartment Of Electrical And Computer Engineering. National University Of Singapore

Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.

Department Of Electrical Engineering The National University Of Singapore

Department Of Electrical Engineering The National University Of Singapore

Department Of Electrical Engineering The National University Of Singapore

Department of Electrical Engineering, The National University of Singapore

Department Of Electrical Engineering The National University Of Singapore