New Standby Degradation Mode in n-Channel MOSFETs with Thin Gate Oxide
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-04-30
著者
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Uchida H
Department Of Chemistry Faculty Of Science And Technology Sophia University
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Shinohara Hirofumi
Device Business Group Oki Electric Industry Co. Ltd.
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Tanaka H
Bu Electronic Materials Cariant (japan) K.k.
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TANAKA Hiroyuki
Device Business Group, Oki Electric Industry Co., Ltd.
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UCHIDA Hidetsugu
Device Business Group, Oki Electric Industry Co., Ltd.
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IDA Jiro
Device Business Group, Oki Electric Industry Co., Ltd.
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Ida J
Device Business Group Oki Electric Industry Co. Ltd.
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