Evaluation of an Electric Field over Sample Surfaces by Electron Standing Waves in a Vacuum Gap of Scanning Tunneling Microscopy

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 2000-06-30

著者

• Tomitori Masahiko

  School Of Materials Science Japan Advanced Institute Of Science And Technology

• Suganuma Yoshinori

  School Of Materials Science Japan Advanced Institute Of Science And Technology

関連論文

• Scanning Auger Electron Microscopy Evaluation and Composition Control of Cantilevers for Ultrahigh Vacuum Atomic Force Microscopy ( Scanning Tunneling Microscopy)
• Simultaneous imaging of tunneling current variation by noncontact atomic force microscopy in ultrahigh vacuum
• Sharpening Processes of Scanning Tunneling Microscopy/Scanning Tunneling Spectroscopy Tips by Thermal Field Treatment ( Scanning Tunneling Microscopy)
• Differential Conductance Imaging of Si and Ge Islands Deposited on Si(001) by Scanning Tunneling Microscopy
• Evaluation of an Electric Field over Sample Surfaces by Electron Standing Waves in a Vacuum Gap of Scanning Tunneling Microscopy
• Detection improvement for electron energy spectra for surface analysis using a field emission scanning tunneling microscope
• Energy spectra of electrons backscattered from sample surfaces with heterostructures using field-emission scanning tunneling microscopy
• Evaluation of an Electric Field over Sample Surfaces by Electron Standing Waves in a Vacuum Gap of Scanning Tunneling Microscopy

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