Evaluation of an Electric Field over Sample Surfaces by Electron Standing Waves in a Vacuum Gap of Scanning Tunneling Microscopy
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概要
- 論文の詳細を見る
Electric field intensities over sample surfaces have been evaluated from peak intervals of differential conductance oscillation due to electron standing waves, which are excited in a vacuum gap of scanning tunneling microscopy. By comparing the intervals measured for different samples of Au(111), Si(111), Si(001) and Ge(001) with tips of similar radius, we have demonstrated that the electric field intensities are different on these surfaces. This study provides a new method to evaluate the electric field near surface regions on a nanometer scale.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2000-06-30
著者
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Tomitori Masahiko
School Of Materials Science Japan Advanced Institute Of Science And Technology
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Suganuma Yoshinori
School Of Materials Science Japan Advanced Institute Of Science And Technology
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Suganuma Yoshinori
School of Materials Science, Japan Advanced Institute of Science and Technology, 1-1 Asahidai, Tatsunokuchi, Nomi-gun, Ishikawa 923-1292, Japan
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- Differential Conductance Imaging of Si and Ge Islands Deposited on Si(001) by Scanning Tunneling Microscopy
- Evaluation of an Electric Field over Sample Surfaces by Electron Standing Waves in a Vacuum Gap of Scanning Tunneling Microscopy
- Detection improvement for electron energy spectra for surface analysis using a field emission scanning tunneling microscope
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- Evaluation of an Electric Field over Sample Surfaces by Electron Standing Waves in a Vacuum Gap of Scanning Tunneling Microscopy