Sharpening Processes of Scanning Tunneling Microscopy/Scanning Tunneling Spectroscopy Tips by Thermal Field Treatment (<Special Issue> Scanning Tunneling Microscopy)
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概要
- 論文の詳細を見る
In order to prepare a scanning tip suitable for scanning tunneling microscopy (STM)/scanning tunneling spectroscopy (STS) operated in ultrahigh vacuum (UHV) with a reproducible and ideal profile of the [111]-oriented W tip, sharpening and cleaning treatments were carried out by heating the tip while applying high voltage in UHV (thermal field (T-F) treatment). The treated tips were evaluated by field emission microscopy (FEM). The appropriate values to build up the W tip along the [111] axis for a treatment parameter, |V/_<T-F>/V_<base>|, range from 2 to 2.6 under fixed conditions of tip heating temperature and time of about 1300 K and 60 s, respectively. It has been also realized that the formation of an ideal tip completely surrounded by three {112} facets at its apex requires a successive heat treatment: an initial T-F treatment, simple heating at about 1000 K to develop the {112} facets, and a final T-F treatment.
- 社団法人応用物理学会の論文
- 1997-06-30
著者
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NISHIKAWA Osamu
Department of Materials Science and Engineering, The Graduate School at Nagatsuta, Tokyo Institute o
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Nagai Minoru
School Of Materials Science Japan Advanced Institute Of Science And Technology
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TOMITORI Masahiko
School of Materials Science, Japan Advanced Institute of Science and Technology
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Nishikawa Osamu
Department Of Earth Sciences Faculty Of Science Kanazawa University
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Nishikawa Osamu
Department Of Materials Science And Engineering Faculty Of Engineering Kanazawa Institute Of Technol
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Tomitori Masahiko
School Of Materials Science Japan Advanced Institute Of Science And Technology
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Nishikawa Osamu
Department of Biology and Chemistry, Kanazawa Institute of Technology, 7-1 Ohgigaoka, Nonoichi, Ishikawa 921-8501, Japan
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NISHIKAWA Osamu
Department of Anatomy II, School of Veterinary Medicine, Azabu University
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