Differential Conductance Imaging of Si and Ge Islands Deposited on Si(001) by Scanning Tunneling Microscopy
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概要
- 論文の詳細を見る
The current modulation imaging techniques based on scanning tunneling microscopy (STM) were applied to Si and Ge islands grown on a Si(001) surface to reveal the atomic and electronic structures of their surfaces. These techniques are advantageous for acquiring both the images of topography and electronic states with a good signal/noise in a short time over the sample surface. The topographic effect over the step of the islands was demonstrated as an artifact that appears in the images of the electronic states.
- 社団法人応用物理学会の論文
- 1998-06-30
著者
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Tomitori Masahiko
School Of Materials Science Japan Advanced Institute Of Science And Technology
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Suganuma Y
Japan Advanced Inst. Sci. And Technol. Ishikawa Jpn
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SUGANUMA Yoshinori
School of Materials Science, Japan Advanced Institute of Science and Technology
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Suganuma Yoshinori
School Of Materials Science Japan Advanced Institute Of Science And Technology
関連論文
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- Sharpening Processes of Scanning Tunneling Microscopy/Scanning Tunneling Spectroscopy Tips by Thermal Field Treatment ( Scanning Tunneling Microscopy)
- Differential Conductance Imaging of Si and Ge Islands Deposited on Si(001) by Scanning Tunneling Microscopy
- Evaluation of an Electric Field over Sample Surfaces by Electron Standing Waves in a Vacuum Gap of Scanning Tunneling Microscopy
- Detection improvement for electron energy spectra for surface analysis using a field emission scanning tunneling microscope
- Energy spectra of electrons backscattered from sample surfaces with heterostructures using field-emission scanning tunneling microscopy
- Evaluation of an Electric Field over Sample Surfaces by Electron Standing Waves in a Vacuum Gap of Scanning Tunneling Microscopy