侵入深さ一定法による残留応力分布の放射光非破壊測定(S06-2 材料内部の非破壊応力評価,S06 放射光による応力測定と残留応力評価)

概要

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The X-ray method is known as the most powerful method to measure the subsurface distribution of residual stresses. To obtain the precise stress distribution, the constant penetration depth (PCD) method by proposed Akiniwa et al was extended to be applicable for non-equi-biaxial state of stresses. The PCD method is only applicable to polycrystals without strong texture. For the thin films with fiber texture, the scattering vector constant (SVC) method was proposed. The CPD method was applied to measure the residuals tress distribution of silicon nitride bombarded with steel fine particles, and the SVC method was applied to TiN thin films carted on steel substrate by the ion beam mixing method.
一般社団法人日本機械学会の論文
2004-09-04