Determination of the Atomic Scattering Factors of Germanium by Means of the Pendellosung-Beat Measuremernt Using White Radiations

概要

論文の詳細を見る
An attempt was made to measure the Pendellosung intensity beats of white radiations diffracted from parallel-sided single crystal wafers of germanium by the energy-dispersive diffraction technique. The extremum positions in the beats were determined to evaluate the atomic scattering factors for seven reflections, 111 to 511. The scattering factor showed a clear wavelength dependence in the wavelength range between 0.3 and 0.6 A, which can be expected from the dispersion correction term f', as calculated by Cromer. From the measured values of (f^0_<hkl>+f')e^<-M> at 0.4 A, the f^0_<hkl> values for the seven reflections were evaluated by using Cromer's f' value and the characteristic temperature, Θ_M=290 K, which has been reported by Batterman and Chipman and by Ludewig. The obtained f^0_<hkl> values, except for the 111 reflection, were almost the same as the data by Matsushita and Kohra.
社団法人応用物理学会の論文
1981-07-05