A New Method for Measuring the X-Ray "Pendellosung" Beats at the Center of the Borrmann Fan Using White Radiations
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概要
- 論文の詳細を見る
A new technique is proposed to measure the X-ray Pendellosung intensity beats using white radiations and parallel-sided single crystals. The beats are measured at the center of the Borrmann fan on the exit surface of a thick Si specimen. The atomic scattering factors of Si are determined for the 220 reflection with an accuracy remarkably higher than that in the previous method.
- 社団法人応用物理学会の論文
- 1983-05-20
著者
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Takama Toshihiko
Department Of Applied Physics Faculty Of Engineering Hokkaido University
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Kobayashi Kazuyoshi
Department Of Applied Physics Faculty Of Engineering Hokkaido University
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Takama T
Hokkaido Univ. Sapporo Jpn
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NOTO Nobuhiko
Department of Applied Physics, Faculty of Engineering, Hokkaido University
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Noto Nobuhiko
Department Of Applied Physics Faculty Of Engineering Hokkaido University
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KOBAYASHI KAZUYOSHI
Department of Anatomy, School of Medicine Keio University
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