Interface Effects on Drain Current Instability in GaAs MESFETs with Buffer Layer : B-2: GaAs FET/LED AND DETECTOR
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1980-04-30
著者
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Itoh Tomohiro
Department Of Electronic Engineering University Of Tokyo
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Yanai Hisayoshi
Department Of Electronic Engineering University Of Tokyo
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Yanai Hisayoshi
Department Of Electronic Engineering Faculty Of Engineering University Of Tokyo
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Itoh Tomohiro
Department Of Bioactive Molecutes Pharmacognosy Gifu Pharmaceutical University
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- Interface Effects on Drain Current Instability in GaAs MESFETs with Buffer Layer : B-2: GaAs FET/LED AND DETECTOR
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