Application of Multiple Asymmetric Diffractions to the High Precision X-Ray Spectroscopy : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION
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- High-Resolution Measurements of Nuclear Bragg Scattering from a Synthetic α-^Fe_2O_3 Crystal
- Absolute Measurement of Lattice Spacing d(220) Silicon Crystal in Floating Zone
- Nature of Tip-Sample Interaction in Dynamic Mode Atomic Force Microscopy
- Tip-Induced Surface Disorder on Hydrogen-Terminated Silicon(111) Surface Observed by Ultrahigh-Vacuum Atomic Force Microscopy
- Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force Microscopy
- Atomic Force Microscopy of Cracks on Si(100) and GaAs(100) Caused by Vickers Indenter
- A New Result with a Two Crystal Component Neutron Interferometer
- Neutron Bragg-Case Rocking Curves from the Front and Back Surfaces of a Silicon Crystal Plate
- Construction of Two Crystal Component Neutron Interferometer
- Light Bounces in Two-Beam Scanning Laser Interferometers
- Application of Multiple Asymmetric Diffractions to the High Precision X-Ray Spectroscopy : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION