Direct Observation of the Segregated Microstructures within Co-Cr Film Grains
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概要
- 論文の詳細を見る
The existence of a segregated microstructure within sputtered 4.1 μm-thick Co-22 at%Cr film grains is proved directly by high-spatial-resolution X-ray microanalysis. The results indicate the existence of grains comprising a Cr-rich core surrounded by a Co-rich ring, and an indication of Cr-enriched grain boundaries. This microstructure coincides well with the latent microstructure revealed by selective wet-etching with dilute aqua regia.
- 社団法人応用物理学会の論文
- 1989-02-20
著者
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MAEDA Yasushi
NTT Basic Research Laboratories
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Maeda Yasushi
Ntt Basic Research Laboratories Tokai
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TAKAHASHI Masaya
NTT Basic Research Laboratories
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Takahashi Masaya
Ntt Basic Research Laboratories Tokai
関連論文
- Microstructural Analysis of CoCr Thin Films by Small-Angle Neutron Scattering
- Bias Effect on Compositional Separation in Sputtered Co-Cr Films
- NMR Study of Magnetic and Compositional Inhomogeneities in Co-Cr Thin Films
- NMR Study on Compositional Inhomogeneity in Electroless-Deposited CoNiP Films for Perpendicular Magnetic Recording
- Micromagnetic Domain Observations of Co-Cr-Ta Films Using Neutron Scattering
- Point Magnetic Recording Using a Force Microscope Tip on Co-Cr Perpendicular Media with Compositionally Separated Microstructures
- Selective Dry Etching to Reveal Compositional Imhomogeneity in Co-Cr Magnetic Films
- NMR Study of Compositional Inhomogeneities in Sputtered Co-Cr Films
- The Effect of Ejection Angle in Ion-Beam Sputter Deposition of Superconducting Amorphous Beryllium Film
- NMR Study on Compositional Distribution in Sputter-Deposited Co-Ni Thin Films
- Detection of Compositional Separation in Co-Ru Alloy Magnetic Films
- Thermodynamics in Co-Cr Mangetic Alloy Thin Films
- Selective Chemical Etching of Latent Compositional Microstructures in Sputtered Co-Cr Films
- Direct Observation of the Segregated Microstructures within Co-Cr Film Grains