Point Magnetic Recording Using a Force Microscope Tip on Co-Cr Perpendicular Media with Compositionally Separated Microstructures

概要

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A soft magnetic force microscope (MFM) tip was used to evaluate the magnetic recording characteristics of compositionally separated Co-Cr perpendicular media. Small magnetic bits were recorded on thick (350 nm) and thin (100 nm) films, focusing on the fineness of compositionally separated microstructures. MFM images showed bit marks 230 and 150 nm in diameter, measured at full-width at half maximum (FWHM) for the thick and thin films, respectively. These results verify that the recordable bit size can be decreased by using a thinner film with a finer compositionally separated microstructure. Simulation was used to clarify the relationship between the actual sizes of the recorded bits and the sizes of their MFM images. The recorded bit size was found to closely correspond to the FWHM of the MFM bit images.
社団法人電子情報通信学会の論文
1995-11-25