Observation of Interface Stress in Barrier/Y-Ba-Cu-O Structure by Laser Raman Scattering Spectroscopy
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1991-10-15
著者
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MATSUI Toshiyuki
Fuji Electric Corporate Research and Development, Ltd.
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Matsui Toshiyuki
Fuji Electric Corporate Research And Development Ltd.
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MATSUBARA Gensoh
Research Center for Advanced Science and Technology, The University of Tokyo
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OKABE Yoichi
Research Center for Advanced Science and Technology, The University of Tokyo
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Matsubara Gensoh
Research Center For Advanced Science And Technology The University Of Tokyo
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Okabe Yoichi
Research Center For Advanced Science And Technology The University Of Tokyo
関連論文
- Relationship between Surface Roughness and Barrier Uniformity
- Cross-Sectional Observation in (103)-Oriented YBa_2Cu_3O_x/SrTiO_3/(013)-Oriented YBa_2Cu_3O_x Tunnel Junction
- Fabrication of Tunnel Junctions with YBCO/Insulator/YBCO Layered Structure Using (013)-Oriented Films as Base Layer
- Observation of Interface Stress in Barrier/Y-Ba-Cu-O Structure by Laser Raman Scattering Spectroscopy
- Characterization of YBa_2Cu_3O_ Co-planar Josephson Junctions Using Focused Ion Beam(Special Issue on Superconductive Electron Devices and Their Applications)
- Co-planar Josephson Junction Using Nonsuperconductive YBaCuO Formed on Very Locally Damaged Substrate by FIB
- Fabrication of YBCO/PBCO/SrTiO_3/PBCO/YBCO Layered Structure for Superconductor-Insulator-Superconductor Tunnel-Type Josephson Junction
- Capacitance-Voltage Characteristics of Au/PrBa_2Cu_3O_y/YBa_2Cu_3O_x Structure Measured at 4.2 K
- Capacitance and Resistance Measurement of Au/PrBa_2Cu_3O_y/YBa_2Cu_3O_x Structure at 4.2 K