Capacitance and Resistance Measurement of Au/PrBa_2Cu_3O_y/YBa_2Cu_3O_x Structure at 4.2 K

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概要

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• The capacitance and the resistance of the Au/PrBa_2Cu_3O_y (PBCO)/YBa_2Cu_3O_x (YBCO) structure were measured at liquid helium temperature. A film of YBCO was deposited by rf magnetron sputtering at 700℃, and its thickness was 250 nm. A film of PBCO was deposited by rf magnetron sputtering at 690℃, and its thickness was less than 375 nm. The inverse capacitance and the resistance of the structure increased with PBCO thickness when PBCO thickness was more than 70 nm. However, the inverse capacitance was near zero, and the resistance was much less than that of PBCO itself when PBCO thickness was less than 70 nm. These results show the possibility that the electric property of PBCO within 70 nm from the PBCO/YBCO interface is different from that of PBCO itself, that is, there is a low-resistance region in PBCO near the YBCO/PBCO interface.

• 社団法人電子情報通信学会の論文
• 1995-05-25

著者

• Ohmameuda Toshiaki

  Research Center For Advanced Science And Technology The University Of Tokyo

• Okabe Yoichi

  Research Center For Advanced Science And Technology The University Of Tokyo

関連論文

• Observation of Interface Stress in Barrier/Y-Ba-Cu-O Structure by Laser Raman Scattering Spectroscopy
• Characterization of YBa_2Cu_3O_ Co-planar Josephson Junctions Using Focused Ion Beam(Special Issue on Superconductive Electron Devices and Their Applications)
• Co-planar Josephson Junction Using Nonsuperconductive YBaCuO Formed on Very Locally Damaged Substrate by FIB
• Fabrication of YBCO/PBCO/SrTiO_3/PBCO/YBCO Layered Structure for Superconductor-Insulator-Superconductor Tunnel-Type Josephson Junction
• Capacitance-Voltage Characteristics of Au/PrBa_2Cu_3O_y/YBa_2Cu_3O_x Structure Measured at 4.2 K
• Capacitance and Resistance Measurement of Au/PrBa_2Cu_3O_y/YBa_2Cu_3O_x Structure at 4.2 K

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