Fine Particles of Silicon. II. : Decahedral Multiply-Twinned Particles
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Decahedral multiply-twinned particles of Si, 60-80 nm in size, prepared by a gas evaporation method are studied by a high resolution electron microscope. A mismatch arising in packing five tetrahedra is accommodated by deforming plastically one of the tetrahedra by introducing a small angle grain boundary. A core region of the particle, however, is deformed elastically. The structural details of the crystalline faults associated with the mismatch are described.
- 社団法人応用物理学会の論文
- 1987-03-20
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