Quantitative Surface Atomic Structure Analysis by Low-Energy Ion Scattering Speetroscopy (ISS)
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概要
- 論文の詳細を見る
Surface atomic structure analysis by low-energy ion scattering spectroscopy (ISS) is reviewed, with particular emphasis on quantitative surface atomic structure analysis by ISS. The important differences between ISS and Rutherford backscattering spectroscopy (RBS), some basic characteristics of ISS, a special type of ISS called impact-collision ionscattering spectroscopy (ICISS), and the general features of the shadow cone in the energy range of ISS are discussed as a basis for the description of particular examples of ISS studies which follow. The examples are mainly concerned with the analysis of the atoxnic arrangement, defect structure, thermal vibration, and electron spatial distribution of the (001) and (111) surfaces of TiC.
- 社団法人応用物理学会の論文
- 1985-10-20
著者
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Aono Masakazu
National Institute For Research In Inorganic Materials
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Souda Ryutaro
National Institute For Materials Research
関連論文
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- Quantitative Surface Atomic Geometry and Two-Dimensional Surface Electron Distribution Analysis by a New Technique in Low-Energy Ion Scattering
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- Atomic Structure of CaF_2/Si(111) Interface and Defect Formation on CaF_2(111) Surface by Electron Irradiation
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- X-Ray Spectroscopic Studies of SmB_6 : COMBINED USE OF X-RAY EMISSION AND ABSORPTION SPECTRA
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