Observation of T-Wall Domains in NiO Crystal by an Optical Double-Diffraction Method

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概要

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• An optical version of the mirror reflection method has been developed to provide more convenience and flexibility. This method has proved better than conventional X-ray micrography, if the sample is a crystal with mosaic structure. The system has been used to obtain interference fringes, enabling the tilt angle between neighbouring domains to be estimated.

• 社団法人応用物理学会の論文
• 1984-12-20

著者

• NAMIKAWA Kazumichi

  The Institute for Solid State Physics,The University of Tokyo

• Terui K

  The Institute For Solid State Physics The Unversity Of Tokyo

• Terui Kenji

  The Institute For Solid State Physics The University Of Tokyo

• Namikawa Kazumichi

  The Institute For Solid State Physics The University Of Tokyo

• Namikawa Kazumichi

  The Institute For Solid State Physics The Unversity Of Tokyo

関連論文

• X-Ray Resonance Magnetic Scattering
• Crystal-Field Effect on the Transport Properties of PrCu_6 and PrIn_3
• On the Sensitivity of the Fluorescence EXAFS
• Studies on Some Properties of Singlet-Ground-State Compounds and Alloys of Praseodymium
• Observation of T-Wall Domains in NiO Crystal by an Optical Double-Diffraction Method

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