On the Sensitivity of the Fluorescence EXAFS
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概要
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The sensitivity of the fluorescence EXAFS is discussed on the basis of a phenomenological theory and shown to be estimated by a parameter defined by absorption coefficients. Measurements of the fluorescence EXAFS and of the transmission EXAFS are performed on Fe, Cr, and Ni contained in stainless steel SUS 304 with different ratios. Both theoretical and experimental results exhibit a high sensitivity of the fluorescence EXAFS for a dilute component less than about 10%.
- 社団法人応用物理学会の論文
- 1982-11-20
著者
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Hosoya Sukeaki
The Institute For Solid State Physics The University Of Tokyo
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NAMIKAWA Kazumichi
The Institute for Solid State Physics,The University of Tokyo
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Namikawa Kazumichi
The Institute For Solid State Physics The University Of Tokyo
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HOSOYA Sukeaki
The Institute for Solid State Physics, The University of Tokyo
関連論文
- X-Ray Resonance Magnetic Scattering
- Ferromagnetic Resonance Absorption of Single-Crystal Thin Films of Nickel
- Compton Profile of Niobium
- On the Sensitivity of the Fluorescence EXAFS
- Observation of T-Wall Domains in NiO Crystal by an Optical Double-Diffraction Method