Characterization of Photo Leakage Current of Amorphous Silicon Thin-Film Transistors
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1999-11-15
著者
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Endo T
Display Materials And Devices Laboratories Research And Development Center Toshiba Corporation
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YAMAJI Yoshimi
Display Materials and Devices Laboratories, Research and Development Center, Toshiba Corporation
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IKEDA Mitsushi
Display Materials and Devices Laboratories, Research and Development Center, Toshiba Corporation
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AKIYAMA Masahiko
Display Materials and Devices Laboratories, Research and Development Center, Toshiba Corporation
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ENDO Takahiko
Display Materials and Devices Laboratories, Research and Development Center, Toshiba Corporation
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Endo Takahiko
Display Materials And Devices Laboratories Research And Development Center Toshiba Corporation
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Ikeda Mitsushi
Display Materials And Devices Laboratories Research And Development Center Toshiba Corporation
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Yamaji Yoshimi
Display Materials And Devices Laboratories Research And Development Center Toshiba Corporation
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Akiyama Masahiko
Display Materials And Devices Laboratories Research And Development Center Toshiba Corporation
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