Analysis of Drain Field and Hot Carrier Stability of Poly-Si Thin Film Transistors
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概要
- 論文の詳細を見る
- 1998-04-15
著者
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AYRES J.
Philips Research Laboratories
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Ayres J.
Philips Research
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Mcculloch David
Philips Research Laboratories
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Brotherton Stan
Philips Research Laboratories
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TRAINOR Michael
Philips Research Laboratories
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Ayres J.Richard
Philips Research Laboratories
関連論文
- Numerical Analysis of the Electrical Characteristics of Gate Overlapped Lightly Doped Drain Polysilicon Thin Film Transistors
- Analysis of Drain Field and Hot Carrier Stability of Poly-Si Thin Film Transistors
- Differentiation of Effects due to Grain and Grain Boundary Traps in Laser Annealed Poly-Si Thin Film Transistors
- Differentiation of Effects Due to Grain and Grain Boundary Traps in Laser Annealed Poly-Si Thin Film Transistors
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