Differentiation of Effects Due to Grain and Grain Boundary Traps in Laser Annealed Poly-Si Thin Film Transistors
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概要
- 論文の詳細を見る
- 1997-09-16
著者
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Armstrong G.
Department Of Electrical And Electronic Engineering The Queen's University Of Belfast
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UPPAL S.
Department of Electrical and Electronic Engineering The Queen's University of Belfast
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AYRES J.
Philips Research Laboratories
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BROTHERTON S.
Department of Electrical and Electronic Engineering, Queens University of Belfast
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AYRES J.
Department of Electrical and Electronic Engineering, Queens University of Belfast
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Uppal S.
Department Of Electrical And Electronic Engineering The Queen's University Of Belfast
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Ayres J
Philips Res. Lab. Surrey Gbr
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Brotherton S
Philips Res. Lab. Surrey Gbr
関連論文
- Analysis of Drain Field and Hot Carrier Stability of Poly-Si Thin Film Transistors
- Differentiation of Effects due to Grain and Grain Boundary Traps in Laser Annealed Poly-Si Thin Film Transistors
- Differentiation of Effects Due to Grain and Grain Boundary Traps in Laser Annealed Poly-Si Thin Film Transistors
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