Dielectric Confinement Effects on the Impurity and Exciton Binding Energies of Silicon Dots Covered with a Silicon Dioxide Layer
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1997-10-15
著者
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Horii Kenju
Department Of Computer Engineering Faculty Of Information Sciences Hiroshima City University
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IWAMATSU Masao
Department of Computer Engineering, Faculty of Information Sciences, Hiroshima City University
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Iwamatsu Masao
Department Of Computer Engineering Hiroshima City University
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Iwamatsu Masao
Department Of Computer Engineering Faculty Of Information Sciences Hiroshima City University
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Horii Kenju
Department of Computer Engineering, Hiroshima City University
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- Dielectric Confinement Effects on the Impurity and Exciton Binding Energies of Silicon Dots Covered with a Silicon Dioxide Layer
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