New Tilting Mechanism of Electron Gun for Reflection High-Emergy Electron Diffraction
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概要
- 論文の詳細を見る
A new type of mechanism for tilting a reflection high-energy electron diffraction (RHEED) gun has been designed and constructed, which enables us to change the glancing angle of the primary electron beam when the specimen surface is located not only at a fixed position but also is moved to other positions. This is an advantage when other measurements are simultaneously undertaken with RHEED. RHEED measurements of a Si(110) surface were performed by placing the Si(110) surface at different positions, and the ability was verified.
- 社団法人応用物理学会の論文
- 1995-04-15
著者
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Oyama Hisashi
The Institute Of Physical And Chemical Research(riken)
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Ichikawa T
Fdk Corp. Shizuoka Jpn
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Ichikawas Toshihiro
Department of Physics, School of Science and Technology, Meiji University
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Oyama Hisashi
Department of Physics, School of Science and Technology, Meiji University
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Ichikawas Toshihiro
Department of Electrical and Electronic Engineering, Faculty of Engineering
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