Improvement in the Uniformity of Resistivity in a Magnetron-Sputtered Indium Tin Oxide Film by Controlling the Plasma Flux Distribution (<Special Issue> Plasma Processing)
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1994-07-30
著者
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ICHIHARA Katsutaro
Materials and Devices Labs, R&D Center, Toshiba Corp.
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Ichihara Katsutaro
Materials And Devices Laboratories Toshiba Research And Development Center
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OKUBO Michiko
Materials and Devices Laboratories, Toshiba Research and Development Center
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Okubo Michiko
Materials And Devices Laboratories Toshiba Research And Development Center
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- Improvement in the Uniformity of Resistivity in a Magnetron-Sputtered Indium Tin Oxide Film by Controlling the Plasma Flux Distribution ( Plasma Processing)
- Reactive Ion Etching of Co-Zr-Nb Thin Film Using BCl_3
- Reactive Ion Etching of Co–Zr–Nb Thin Film Using BCl3