Near-Infrared Transmission Measurement of EL2 Concentration in Semi-Insulating GaAs Wafers with a Laser Diode (λ=1.3μm)
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1991-07-15
著者
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Pan C‐l
National Chiao Tung Univ. Hsinchu Twn
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Pan Ci-ling
Institute Of Electro-optical Engineering National Chiao Tung University
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Pan Ci-ling
Institute Of Electro-optical Engineering National Chiao-tung University
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Pan Ci-ling
Institute Of Electro-optic Engineering National Chiao Tung University
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Wu H‐h
Tunghai Univ. Taichung Twn
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WU Hsiao-Hua
Institute of Electro-Optical Engineering, National Chiao-Tung University
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HSIEH Tzung-Rue
Institute of Electro-Optical Engineering, National Chiao-Tung University
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Wu Hsiao-hua
Institute Of Electro-optical Engineering National Chiao Tung University
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Hsieh Tzung-rue
Institute Of Electro-optical Engineering National Chiao-tung University
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- Near-Infrared Transmission Measurement of EL2 Concentration in Semi-Insulating GaAs Wafers with a Laser Diode (λ=1.3μm)
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