Hg_<1-x>Cd_xTe Surface after Chemical Etching and Electrochemical Reduction

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概要

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• Surface compositions of Hg_<1-x>Cd_xTe (MCT) after chemical etching and electrochemical reduction have been studied with an angle-dependent X-ray pltotoelectron spectroscopy (XPS) technique. The degree of oxidation formed after the chemical etching in Br_2-methanol solutions is dependent on Br_2 concentration but independent of etching time. The etched surface is Te-rich. The cation fraction x deviates from that of the bulk value. The oxides and accumulated elemental Te are eliminated from the etched surface by the reduction at -0.9 V vs Ag/AgCl for 1 h in pH 5.0 acetic-acetate solution. The cation / anion ratio and cation fraction x approach the bulk value and are constant in the depth. Furthermore, it is confirmed that the electrochemically reduced surface is more stable in atmospheric oxygen than the chemically etched MCT. This electrochemical reduction is used for treatment prior to surface passivation.

• 社団法人応用物理学会の論文
• 1991-11-15

著者

• Shimanoe Kengo

  Advanced Materials & Technology Research Laboratories Nippon Steel Corporation

• Sakashita Masao

  Advanced Materials & Technology Research Laboratories Nippon Steel Corporation

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